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Institut für Informatik
 

Technical Report No.105, July - Abstract


Drechsler, Nicole; Keim, Martin
Combining GAs and Symbolic Methods for High Quality Tests of Sequential Circuits

A symbolic fault simulator is integrated in a Genetic Algorithm (GA) environment to perform {Automatic Test Pattern Generation} (ATPG) for synchronous sequential circuits. In a two phase algorithm test length and fault coverage as well are optimized. However, there are circuits, that are hard to test using random pattern sequences, even if these sequences are genetically optimized. Thus, deterministic aspects are included in the GA environment to improve fault coverage. Experiments demonstrate that both a priori time consuming strategies can be combined at reasonable costs: Tests with higher fault coverages and considerably shorter test sequences than previously presented approaches are obtained.


Report No.105(PostScript)